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Carsem is focused on turn-key services and thus has a total dedicated test and wafer probe area of 105,000 sq ft (9,800 sq m) containing over 500 testers and handlers. Carsem provides a full range of test services to meet the unique needs of our customer's device requirements including RF, mixed signal and power applications and currently test over 60% of the total units we assemble. (For more information about the MLP package family click here)
Carsem maintains a dynamic tester and handler technology roadmap to align our investments to our customer's needs and has a core dedicated staff of product, process and test engineers capable of developing custom solutions from scratch to address any specific device requirements. These solutions include program/hardware development services, program conversions, as well as, complete product engineering support including program debug, correlation, low yield analysis and test time reduction.
We have the ability to test devices for Bluetooth, WLAN, 802.11a/b and a wide variety of other applications using test systems that include the LTX Fusion CX RF, Agilent 84000, Rack and Stack and Teradyne Catalyst/RF. Additional tester platforms for mixed signal, analog and power management devices include the TMT/ASL, Eagle, and Teradyne Microflex. Carsem provides both wafer probe services for wafers up to 8" in diameter (including hot chuck and wafer mapping features) and strip test for various MLP package dimensions (including packages sizes below 2x2 mm) . Other turn-key services include dry pack, tape and reel, finished goods inventory, bar code and drop shipment.
FACILITIES
Location : Malaysia & China
 Floor Space : 105k sq. ft. (9.8K M²)
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EQUIPMENT
MIXED SIGNAL Testers
| Manufacturer | Model | Capability |
| TERADYNE |
A565 | Path ii Test head with 8 APUs, PACs, PVI |
| A575 | 112 digital pins and 48 analog pins, PACS |
| CATALYST-100 |
56 Digital pins, 100Mhz, PACS |
| MICROFLEX |
DC30, DC90, HSD200, BBAC, POOL2 |
| CREDENCE | ASL1000 | DVI, MUX, TMU, PVI, ACS, OAL, OVI, PV3 |
| ASL3000 | DVI2K, DVI300, MUX |
| LTX | TS88/TS80 with MV200/PE3000 | 5 VI, 16 pin matrix, TFE |
| FUSION CX | 802.11 A/B/G, 32OVI, 24DIG, 8RF16Port, 4 SIGGEN |
| EAGLE | ETS-500D | FSS, MPU, APU, DSS, QMS |
| ETS-564 | FSS, MPU, APU, QMS |
| ETS-300 |
FSS, MPU, APU, DSS, QMS, WCU |
| ETS364 |
APU12/SPU100/QTMU/DPU16 |
| ETS200T-FT |
Dual Die MOSFET testing with Rg/UIL |
| ETS88 |
Single Sector with APU12, SPU100, SPU112, QTMU, DPU16 |
| SZ | M3610 | APIN, DPIN, VPIN, TMUX, Power VI Source |
| DOLIAN GRAPHICS | DG50015/100020 | Unclamped Inductive Load Testing Single/Dual Die |
| ITC | 55100/5514 | Unclamped Inductive Load Tests, Single/Dual Die |
| TESEC | 8101-TT | Discrete Device Testing , MOSFET/Transistor |
| 881-TT/A | Discrete Device Testing , MOSFET/Transistor |
| 9614/6915 Delta Vsd | Delta Vsd Testing |
| 8114/8115 Delta Vsd | Delta Vsd Testing |
RF Testers
| Manufacturer | Model | Capability |
| AGILENT | HP84000 |
3RF Ports, CWSRC 2.996 GHz, DC Resources, +/- 20 V; max 12A, DUT Resources +/-12 V max 120 watt |
CREDENCE
TMT |
ASL3000RF |
8 High Power Ports 6GHz, 3SMIQ SigGem, DVI2K, OVI300 |
| LTX |
FUSION CX |
802.11 A/B/G, 32OVI, 24DIG, 8RF16Port, 4 SIGGEN |
| TERADYNE |
CATALYST-100 (RF) |
6GHz with Frequency Hopping |
| A535 |
Gen2 VNA |
| A530/A535 |
UHF & VHF, 5 V/Is, 8 channel, High Speed Digital |
Handlers
| Manufacturer | Model |
Test Sites |
Package Capability |
| AETRIUM | 5050 |
1 |
3 SOICN | SOICW |
| DTS |
2 |
48, 56 TSSOP |
| QTS |
4 |
SOICN | SOICW |
| EXATRON |
27010 |
1 |
SOIC |
| HONTECH |
9080 |
8 |
QFP | MLP | ARRAY PACKAGES |
| 9040 |
4 |
QFP | MLP | ARRAY PACKAGES |
| ISMECA |
TMBU-GA |
1 |
SOT223 | 3 SOT23 |
| NT216 |
2 |
3,5,6 SOT23 | 5, 6 SC70 | SOD323 |
| NX16 |
4 |
SOT23 |
| MCT |
4610/4600 |
1 |
28, 44 PLCC |
| 3608 |
1 |
3 SOT 23 | 8, 14, 16 SOIC | 3, 5 DDPAK |
| MULTITEST |
85XX |
1 | 2 |
44 PLCC |
| 8704 |
1 |
SOICN | SSOP |
| 9308 |
4 |
QSOP | SOICN | TSSOP |
| 9320 |
4 |
QSOP | SOICN | TSSOP |
| 9918 |
8 |
QFN | MLP |
| 9928 |
8 |
QFN | MLP |
| PentaMaster |
PM6355 |
4 |
SOICN |
| RASCO |
100AH |
4 |
MSOP | SOICN | SSOP |
| SEIKO EPSON |
6040 |
4 |
QFP | MLP | ARRAY PACKAGES |
| SRM |
STV242 |
1 |
SOT143 |
| SYNAX |
141V |
1 |
QFP | MLP | ARRAY PACKAGES |
| TESEC |
9418-HT |
1 |
5 SOT23 |
| 9718-HT |
1 |
5, 6 SOT23 |
| 8918 |
1 |
3, 6 SOT23 | SOT223 |
| 9428-HT |
1 |
8 MSOP |
| 9110 |
1 |
SOT223 | SO8 |
Wafer Probe
| Manufacturer | Model |
Test Sites |
Package Capability |
| TSK | APM90A |
1 |
Wafer Probe (4"-8") |
| UF200 |
1 |
Wafer Probe (4"-8") with wafer mapping capability |
| EG |
EG2001, 2080 |
1 |
Wafer Probe (6") with wafer mapping capability |
| TEL |
TEL8 |
1 |
Wafer Probe (6") with wafer mapping capability |
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